GB/T 24468-2025

Active

Test method for semiconductor equipment reliability, availability and maintainability(RAM)

半导体设备可靠性、可用性和维修性（RAM）测量方法

Standard Type
GBT
ICS
17.040.30
CCS
L85
Status
现行
Issue Date
2025-10-05
Implementation
2026-05-01
Responsible Dept
国家标准委
Drafting Unit
N/A