GB/T 23414-2009

Active

Microbeam analysis - Scanning electron microscopy - Vocabulary

微束分析 扫描电子显微术 术语

Standard Type
GBT
ICS
37.020;01.040.37
CCS
N33
Status
现行
Issue Date
2009-04-01
Implementation
2009-12-01
Responsible Dept
国家标准委
Drafting Unit
N/A