GB/T 22572-2008

Active

Surface chemical analysis - Secondary-ion mass spectrometry - Method for estimating depth resolution parameters with multiple delta-layer reference materials

表面化学分析 二次离子质谱 用多δ层参考物质评估深度分辨参数的方法

Standard Type
GBT
ICS
71.040.40
CCS
G04
Status
现行
Issue Date
2008-12-11
Implementation
2009-10-01
Responsible Dept
中国科学院
Drafting Unit
N/A