GB/T 1553-2009

Abolished

Test methods for minority carrier lifetime in bulk germanium and silicon by measurement of photoconduetivity decay

硅和锗体内少数载流子寿命测定光电导衰减法

Standard Type
GBT
ICS
29.045
CCS
H80
Status
废止
Issue Date
2009-10-30
Implementation
2010-06-01
Responsible Dept
国家标准委
Drafting Unit
N/A