GB/T 14863-2013

Abolished

Method for net carrier density in silicon epitaxial layers by voltage-capacitance of gated and ungated diodes

用栅控和非栅控二极管的电压电容关系测定硅外延层中净载流子浓度的方法

Standard Type
GBT
ICS
29.045
CCS
H80
Status
废止
Issue Date
2013-12-31
Implementation
2014-08-15
Responsible Dept
工业和信息化部（电子）
Drafting Unit
N/A