GB/T 14862-1993

Active

Junction-to-case thermal resistance test methods of packages for semiconductor integrated circuits

半导体集成电路封装结到外壳热阻测试方法

Standard Type
GBT
ICS
31.200
CCS
L55
Status
现行
Issue Date
1993-12-30
Implementation
1994-10-01
Responsible Dept
工业和信息化部（电子）
Drafting Unit
N/A