GB 5594.8-85

Test methods for structural ceramic materials in electronic components—Determination of microstructure

电子元器件结构陶瓷材料性能测定方法　显微结构的测定

Standard Type

GB

ICS

N/A

CCS

N/A

Status

N/A

Issue Date

N/A

Implementation

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Responsible Dept

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Drafting Unit

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