Browse Standards
1450+ standards in database
1450 result(s) found
串行NOR型快闪存储器接口规范
Specification for serial NOR flash interface
半导体芯片产品 第8部分：数据交换的EXPRESS格式
Semiconductor die products—Part8: EXPRESS model schema for data exchange
半导体芯片产品 第6部分：热仿真要求
Semiconductor die products—Part 6: Requirements for concerning thermal simulation
半导体芯片产品 第2部分：数据交换格式
Semiconductor die products—Part 2: Exchange data formats
石英晶体元件参数的测量 第11部分：采用自动网络分析技术和误差校正确定负载谐振频率和有效负载电容的标准方法
Measurement of quartz crystal unit parameters—Part 11:Standard method for the determination of the load resonance frequency fL and the effective load capacitance CLeff using automatic network analyzer techniques and error correction
石英晶体元件参数的测量 第9部分：石英晶体元件寄生谐振的测量
Measurement of quartz crystal unit parameters—Part 9:Measurement of spurious resonances of piezoelectric crystal units
激光产品的安全 第2部分：光纤通信系统(OFCS)的安全
Safety of laser products—Part 2: Safety of optical fibre communication systems (OFCS)
LED显示屏干扰光评价要求
Evaluation requirements for obtrusive light of LED panels
半导体照明设备和系统的光辐射安全测试方法
Measuring methods of optical radiation safety for semiconductor lighting equipments and systems
MEMS电场传感器通用技术条件
General specification for MEMS electric field sensor
电子设备用固定电容器 第26部分：分规范 导电高分子固体电解质铝固定电容器
Fixed capacitors for use in electronic equipment—Part 26: Sectional specification—Fixed aluminium electrolytic capacitors with conductive polymer solid electrolyte
电子设备用固定电容器 第26-1部分：空白详细规范 导电高分子固体电解质铝固定电容器 评定水平EZ
Fixed capacitors for use in electronic equipment—Part 26-1: Blank detail specification—Fixed aluminium electrolytic capacitors with conductive polymer solid electrolyte—Assessment level EZ
集成电路 焊柱阵列试验方法
Integrated circuits—Test methods for column grid array
半导体集成电路 快闪存储器测试方法
Semiconductor integrated circuit—Measuring methods for flash memory
印制电路用金属基覆铜箔层压板通用规范
General specification for metal base copper-clad laminates for printed circuits
半导体集成电路 第三代双倍数据速率同步动态随机存储器 (DDR3 SDRAM)测试方法
Semiconductor integrated circuit—Measuring methods for double data rate 3 synchronous dynamic random access memory(DDR3 SDRAM)
LED应用产品可靠性试验的点估计和区间估计（指数分布）
Point estimation and interval estimation for reliability testing of LED applied products (exponential distribution)
LED加速寿命试验方法
Accelerated life test method for LED
半导体光电子器件 中功率发光二极管空白详细规范
Semiconductor optoelectronic devices—Blank detail specification for middle power light-emitting diodes
半导体光电子器件 小功率发光二极管空白详细规范
Semiconductor optoelectronic devices—Blank detail specification for lower power light-emitting diodes