Browse Standards

1450+ standards in database

1450 result(s) found

GB/T 13555-2017 Active

挠性印制电路用聚酰亚胺薄膜覆铜板

Copper-clad polyimide film laminates for flexible printed circuits

ICS: 31.180
2019-01-01
GB/T 13536-2018 Active

飞机地面供电连接器

Connectors for aircraft ground electrical supplies

ICS: 31.220.10
2018-02-06
GB/T 6346.25-2018 Active

电子设备用固定电容器 第25部分:分规范 表面安装导电高分子固体电解质铝固定电容器

Fixed capacitors for use in electronic equipment—Part 25: Sectional specification—Fixed aluminium electrolytic surface mount capacitors with conductive polymer solid electrolyte

ICS: 31.060.50
2018-07-01
GB/T 6346.2501-2018 Active

电子设备用固定电容器 第25-1部分:空白详细规范 表面安装导电高分子固体电解质铝固定电容器 评定水平EZ

Fixed capacitors for use in electronic equipment—Part 25-1: Blank detail specification—Surface mount fixed aluminum electrolytic capacitors with conductive polymer solid electrolyte—Assessment level EZ

ICS: 31.060.50
2018-07-01
GB/T 35010.4-2018 Active

半导体芯片产品 第4部分:芯片使用者和供应商要求

Semiconductor die products—Part 4: Requirements for die users and suppliers

ICS: 31.200
2018-08-01
GB/T 4377-2018 Active

半导体集成电路 电压调整器测试方法

Semiconductor integrated circuits—Measuring method of voltage regulators

ICS: 31.200
2018-08-01
GB/T 35010.3-2018 Active

半导体芯片产品 第3部分:操作、包装和贮存指南

Semiconductor die products—Part 3: Guide for handling, packing and storage

ICS: 31.200
2018-08-01
GB/T 35009-2018 Active

串行NAND型快闪存储器接口规范

Specification for serial NAND flash interface

ICS: 31.200
2018-08-01
GB/T 14028-2018 Active

半导体集成电路 模拟开关测试方法

Semiconductor integrated circuits—Measuring method of analogue switch

ICS: 31.200
2018-08-01
GB/T 35010.1-2018 Active

半导体芯片产品 第1部分:采购和使用要求

Semiconductor die products—Part 1:Requirements for procurement and use

ICS: 31.200
2018-08-01
GB/T 35011-2018 Active

微波电路 压控振荡器测试方法

Microwave circuits—Measuring methods for voltage controlled oscillater

ICS: 31.200
2018-08-01
GB/T 35010.7-2018 Active

半导体芯片产品 第7部分:数据交换的XML格式

Semiconductor die products—Part 7: XML schema for data exchange

ICS: 31.200
2018-08-01
GB/T 35005-2018 Active

集成电路倒装焊试验方法

Test methods for flip chip integrated circuits

ICS: 31.200
2018-08-01
GB/T 35001-2018 Active

微波电路 噪声源测试方法

Microwave circuits—Measuring methoels for noise source

ICS: 31.200
2018-08-01
GB/T 35002-2018 Active

微波电路 频率源测试方法

Microwave circuits—Measuring methods for frequency source

ICS: 31.200
2018-08-01
GB/T 35003-2018 Active

非易失性存储器耐久和数据保持试验方法

Test methods for endurance and data retention of non-volatile memory

ICS: 31.200
2018-08-01
GB/T 35004-2018 Active

数字集成电路 输入/输出电气接口模型规范

Logic digital integrated circuits—Specification for I/O interface model for integrated circuit

ICS: 31.200
2018-08-01
GB/T 35010.5-2018 Active

半导体芯片产品 第5部分:电学仿真要求

Semiconductor die products—Part 5:Requirements for concerning electrical simulation

ICS: 31.200
2018-08-01
GB/T 35006-2018 Active

半导体集成电路 电平转换器测试方法

Semiconductor integrated circuits—Measuring method of level converter

ICS: 31.200
2018-08-01
GB/T 35007-2018 Active

半导体集成电路 低电压差分信号电路测试方法

Semiconductor integrated circuits—Measuring method of low voltage differential signaling circuitry

ICS: 31.200
2018-08-01
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