Browse Standards

1450+ standards in database

1450 result(s) found

GB/T 31359-2015 Active

半导体激光器测试方法

Test methods of semiconductor lasers

ICS: 31.260
2015-08-01
GB/T 31379-2015 Abolished

平板显示器（FPD）偏光膜试验方法

Test method for flat panel display (FPD) polarizing films

ICS: 31.030
2015-10-01
GB/T 31378-2015 Active

平板显示器（FPD）偏光膜表面硬度的测试方法

Test method for surface hardness of flat panel display (FPD) polarizing film

ICS: 31.030
2015-10-01
GB/T 31370.4-2015 Active

平板显示器（FPD）彩色滤光片测试方法 第4部分：耐化学性

Test mothod of flat panel display (FPD) color filters—Part 4: Chemical resistance

ICS: 31.030
2015-10-01
GB/T 31370.3-2015 Active

平板显示器（FPD）彩色滤光片测试方法 第3部分：耐热性

Test mothod of flat panel display (FPD) color filters—Part 3: Heat resistance

ICS: 31.030
2015-10-01
GB/T 31370.2-2015 Active

平板显示器（FPD）彩色滤光片测试方法 第2部分：耐光性

Test mothod of flat panel display (FPD) color filters—Part 2: Light resistance

ICS: 31.030
2015-10-01
GB/T 31370.1-2015 Active

平板显示器（FPD）彩色滤光片测试方法 第1部分：颜色和透光率

Test mothod of flat panel display (FPD) color filters—Part 1: Color and transmitance

ICS: 31.030
2015-10-01
GB/T 5593-2015 Active

电子元器件结构陶瓷材料

Structure ceramic materials used in electronic component and device

ICS: 31-030
2016-01-01
GB/T 31469-2015 Active

半导体材料切削液

Semiconductor materials cutting fluid

ICS: 31-030
2016-01-01
GB/T 31417-2015 Abolished

等离子显示器用荧光粉

Phosphors for plasma display panel

ICS: 31-030
2016-01-01
GB/T 16525-2015 Active

半导体集成电路 塑料有引线片式载体封装引线框架规范

Semiconductor integrated circuits—Specification of leadframes for plastic leaded chip carrier package

ICS: 31.200
2016-01-01
GB/T 15878-2015 Active

半导体集成电路 小外形封装引线框架规范

Semiconductor integrated circuits—Specification of leadframes for small outline package

ICS: 31.200
2016-01-01
GB/T 15876-2015 Active

半导体集成电路 塑料四面引线扁平封装引线框架规范

Semiconductor integrated circuits—Specification of leadframes for plastic quad flat package

ICS: 31.200
2016-01-01
GB/T 14112-2015 Active

半导体集成电路 塑料双列封装冲制型引线框架规范

Semiconductor integrated circuits—Specification for stamped leadframes of plastic DIP

ICS: 31.200
2016-01-01
GB/T 5598-2015 Active

氧化铍瓷导热系数测定方法

Test method for thermal conductivity of beryllium oxide ceramics

ICS: 31-030
2016-01-01
GB/T 5594.8-2015 Active

电子元器件结构陶瓷材料性能测试方法 第8部分：显微结构的测定方法

Test methods for properties of structure ceramic used in electronic components and device—Part 8: Test method for microstructure

ICS: 31-030
2016-01-01
GB/T 5594.7-2015 Active

电子元器件结构陶瓷材料性能测试方法 第7部分：透液性测定方法

Test methods for properties of structure ceramic used in electronic components and device—Part 7: Test method for liquid permeability

ICS: 31-030
2016-01-01
GB/T 5594.6-2015 Active

电子元器件结构陶瓷材料性能测试方法 第6部分：化学稳定性测试方法

Test methods for properties of structure ceramics used in eletronic components and device—Part 6: Test method for chemical durability

ICS: 31-030
2016-01-01
GB/T 5594.4-2015 Active

电子元器件结构陶瓷材料性能测试方法 第4部分：介电常数和介质损耗角正切值的测试方法

Test methods for properties of structure ceramic used in electronic components and device—Part 4: Test method for permittivity and dielectric loss angle tangent value

ICS: 31-030
2016-01-01
GB/T 5594.3-2015 Active

电子元器件结构陶瓷材料性能测试方法 第3部分：平均线膨胀系数测试方法

Test methods for properties of structure ceramic used in electronic components and device—Part 3: Test method for mean coefficient of linear expansion

ICS: 31-030
2016-01-01
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