Browse Standards

1450+ standards in database

1450 result(s) found

GB/T 4183-2002 Active

钼钨合金丝

Molybdenum-tungsten alloy wire

ICS: 31-030
2003-05-01
GB/T 17562.8-2002 Active

频率低于3 MHz的矩形连接器 第8部分:具有4个信号接触件和电缆屏蔽用接地接触件的连接器详细规范

Rectangular connectors for frequencies below 3MHz--Part 8:Detail specification for connectors,four-signal contacts and earthing contacts for cable screen

ICS: 31.220.10
2003-05-01
GB/T 15157.7-2002 Active

频率低于3 MHz的印制板连接器 第7部分:有质量评定的具有通用插合特性的8位固定和自由连接器详细规范

Connectors for frequencies below 3MHz for use with printed boards--Part 7:Detail specification for connectors,8-way,including fixed and free connectors with common mating features,with assessed quality

ICS: 31.220.10
2003-05-01
GB/T 11297.3-2002 Active

掺钕钇铝石榴石激光棒消光比的测量方法

Test method for extinction ratio of Nd∶YAG laser rods

ICS: 31.260
2003-05-01
GB/T 11297.1-2002 Abolished

激光棒波前畸变的测量方法

Test method for wavefront distortion of laserrods

ICS: 31.260
2003-05-01
GB/T 6589-2002 Active

半导体器件 分立器件 第3-2部分:信号(包括开关)和调整二极管 电压调整二极管和电压基准二极管(不包括温度补偿精密基准二极管) 空白详细规范

Semiconductordevices--Discrete devices--Part 3-2:Signal (including switching) and regulator diodes--Blank detail specification for voltage-regulator diodes and voltage-reference diodes (excluding temperature-compensated precision reference diodes)

ICS: 31.080.10
2003-05-01
GB/T 18910.1-2002 Abolished

液晶和固态显示器件 第1部分:总规范

Liquid crystal and solid-state display devices--Part 1:Generic specification

ICS: 31.120
2003-05-01
GB/T 7154.1-2003 Active

直热式阶跃型正温度系数热敏电阻器 第1-1部分:限流用空白详细规范 评定水平EZ

Thermistors--Directly heated positive step-function temperature coefficient--Part 1-1:Blank detail specification for current limiting application--Assessment level EZ

ICS: 31.040.30
2003-06-01
GB/T 7154.4-2003 Active

直热式阶跃型正温度系数热敏电阻器 第1-4部分:敏感用空白详细规范 评定水平EZ

Thermistors--Directly heated positive step-function temperature coefficient--Part 1-4: Blank detail specification--Sensing application--Assessment level EZ

ICS: 31.040.30
2003-08-01
GB/T 19247.1-2003 Active

印制板组装 第1部分:通用规范 采用表面安装和相关组装技术的电子和电气焊接组装的要求

Printed board assemblies--Part 1: Generic specification--Requirements for soldered electrical and electronic assemblies using surface mount and related assembly technologies

ICS: 31.240
2003-10-01
GB/T 3047.5-2003 Active

高度进制为20mm的台式机箱基本尺寸系列

Series of basic dimensions of cabiners for vertical increment of 20mm

ICS: 31.240
2004-05-01
GB/T 17574.10-2003 Active

半导体器件 集成电路 第2-10部分:数字集成电路 集成电路动态读/写存储器空白详细规范

Semiconductor devices--Integrated circuits--Part 2-10:Digital integrated circuits--Blank detail specification for integrated circuit dynamicread/write memories

ICS: 31.200
2004-08-01
GB/T 8446.2-2004 Abolished

电力半导体器件用散热器 第2部分:热阻和流阻测试方法

Heat sink for power semiconductor device--Part 2:Measuring method of thermal resistance and inputfluid-output fluid pressure difference

ICS: 31.080
2004-08-01
GB/T 3984.2-2004 Active

感应加热装置用电力电容器 第2部分:老化试验、破坏试验和内部熔丝隔离要求

Power capacitors for induction heating installations--Part 2:Ageing test,destruction test and requirements for disconnecting internal fuses

ICS: 31.060.70
2004-08-01
GB/T 18496.2-2005 Active

电子设备用机电开关 第4-1部分:钮子(倒扳)开关 空白详细规范

Electromechanical switches for use in electronic equipment Part 4-1:Sectional specification for lever(toggle)switches Blank detail specification

ICS: 31.220.20
2005-08-01
GB/T 17564.2-2005 Abolished

电气元器件的标准数据元素类型和相关分类模式 第2部分:EXPRESS 字典模式

Standard data element types with associated classification scheme for electric components-Part 2:EXPRESS dictionary schema

ICS: 31.020
2006-04-01
GB/T 4937.1-2006 Active

半导体器件 机械和气候试验方法 第1部分: 总则

Semiconductor devices―Mechanical and climatic test methods―Part 1: General

ICS: 31.080.01
2007-02-01
GB/T 4937.2-2006 Active

半导体器件 机械和气候试验方法 第2部分:低气压

Semiconductor devices―Mechanical and climatic test methods―Part 2: Low air pressure

ICS: 31.080.01
2007-02-01
GB/T 20522-2006 Active

半导体器件 第14-3部分: 半导体传感器-压力传感器

Semiconductor devices Part 14-3: Semiconductor sensors - Pressure sensors

ICS: 31.080.01
2007-02-01
GB/T 20521-2006 Active

半导体器件 第14-1部分: 半导体传感器-总则和分类

Semconductor devices Part 14-1: Semiconductor sensors - General and classification

ICS: 31.080.01
2007-02-01
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