Browse Standards

1450+ standards in database

1450 result(s) found

GB/T 15872-1995 Abolished

半导体设备电源接口

Power supply interface for semiconductor equipment

ICS: 31.220.10
1996-08-01
GB/T 2470-1995 Active

电子设备用固定电阻器、固定电容器型号命名方法

Type designation system for fixed resistors and fixed capacitors for use in electronic equipment

ICS: 31.020
1996-08-01
GB/T 16261-1996 Abolished

印制板总规范

Generic specification of printed boards

ICS: 31.180
1996-10-01
GB/T 16317-1996 Abolished

多层印制电路用限定燃烧性的薄覆铜箔聚酰亚胺玻璃布层压板

Thin polyimide woven glass fabric copper-clad laminated sheet of defined flammability for use in the fabrication of multilayer printed boards

ICS: 31.180
1997-01-01
GB/T 16315-1996 Abolished

印制电路用限定燃烧性的覆铜箔聚酰亚胺玻璃布层压板

Polyimide woven glass fabric copper-clad laminated sheet of defined flammability for printed circuits

ICS: 31.180
1997-01-01
GB/T 8976-1996 Active

膜集成电路和混合膜集成电路总规范

Generic specification for film integrated circuits and hybrid film integrated circuits

ICS: 31.200
1997-01-01
GB/T 7577-1996 Active

低频放大管壳额定的双极型晶体管空白详细规范

Blank detail specification for case-rated bipolar transistors for low-frequency amplification

ICS: 31.080.30
1997-01-01
GB/T 7338-1996 Active

电子设备用固定电阻器 第6部分:分规范 各电阻器可单独测量的固定电阻网络

Fixed resistors for use in electronic equipment--Part 6:Sectional specification--Fixed resistor networks with individually measurable resistors

ICS: 31.040.10
1997-01-01
GB/T 16466-1996 Active

膜集成电路和混合膜集成电路空白详细规范(采用能力批准程序)

Blank detailspecification for film integrated circuits and hybrid film integrated circuits on the basis of the capability approval procedures

ICS: 31.200
1997-01-01
GB/T 16465-1996 Active

膜集成电路和混合膜集成电路分规范(采用能力批准程序)

Sectional specification for film integrated circuits and hybrid film integrated circuits on the basis of the capability approval procedures

ICS: 31.200
1997-01-01
GB/T 6798-1996 Active

半导体集成电路 电压比较器测试方法的基本原理

Semiconductor integrated circuits--General principles of measuring methods of voltage comparators

ICS: 31.200
1997-01-01
GB/T 4377-1996 Abolished

半导体集成电路 电压调整器测试方法的基本原理

Semiconductor integrated circuits--General principles of measuring methods of voltage regulator

ICS: 31.200
1997-01-01
GB/T 16464-1996 Active

半导体器件 集成电路 第1部分:总则

Semiconductor devices--Integrated circuits--Part 1:General

ICS: 31.200
1997-01-01
GB/T 4597-1996 Abolished

电子管词汇

Vocabulary of electronic tubes

ICS: 31.100
1997-07-01
GB/T 5596-1996 Active

电容器用陶瓷介质材料

Ceramic dielectric materials used for capacitors

ICS: 31-030
1997-05-01
GB/T 16528-1996 Active

压敏电阻器用氧化锌陶瓷材料

Zinc oxide ceramics for use in varistors

ICS: 31-030
1997-05-01
GB/T 16516-1996 Active

石英晶体元件 电子元器件质量评定体系规范 第2部分:分规范 能力批准

Quartz crystal units--A specification in the quality assessment system for electronic components--Part 2:Sectional specification--Capability approval

ICS: 31.020
1996-05-01
GB/T 16527-1996 Active

硬面感光板中光致抗蚀剂和电子束抗蚀剂规范

Specification for photoresist/E-beam resist for hard surface photoplates

ICS: 31.200
1997-05-01
GB/T 16523-1996 Active

圆形石英玻璃光掩模基板规范

Specification for round quartz photomask substrates

ICS: 31.200
1997-05-01
GB/T 16517-1996 Active

石英晶体元件 电子元器件质量评定体系规范 第3部分:分规范 鉴定批准

Quartz crystal units--A specification in the quality assessment system for electronic components--Part 3:Sectional specification--Qualification approval

ICS: 31.020
1997-05-01
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