Browse Standards

1450+ standards in database

1450 result(s) found

GB/T 3790-1995 Active

荧光显示管测试方法

Methods of measurement for fluorescent display tubes

ICS: 31.120
1996-04-01
GB/T 15653-1995 Active

金属氧化物半导体气敏元件测试方法

Measuring methods for gas sensors of metal-oxide semiconductor

ICS: 31.020
1996-04-01
GB/T 15648-1995 Active

辉光放电显示管测试方法

Methods of measurement for glow discharge display tubes

ICS: 31.100
1996-04-01
GB/T 15650-1995 Abolished

半导体集成电路系列和品种 CMOS门阵列电路系列的品种

Series and productsfor semiconductor integrated circuits--Products of series for CMOS gate array

ICS: 31.200
1996-04-01
GB/T 4475-1995 Active

敏感元器件术语

Terms of sensor

ICS: 31.020
1996-04-01
GB/T 3788-1995 Active

真空电容器通用技术条件

General specification for vacuum capacitors

ICS: 31.060
1996-08-01
GB/T 15768-1995 Active

电容式湿敏元件与湿度传感器总规范

General specification for the capacitance type humidity sensor and transducer

ICS: 31.020
1996-08-01
GB/T 9313-1995 Active

数字电子计算机用阴极射线管显示设备通用技术条件

General specifications for CRT display device of computer

ICS: 31.120
1996-08-01
GB/T 15885-1995 Abolished

电子设备用固定电阻器 第4部分:空白详细规范 功率型固定电阻器 评定水平 F

Fixed resistors for use in electronic equipment--Part 4:Blank detail specification--Fixed power resistors--Assessment level F

ICS: 31.040.10
1996-08-01
GB/T 15884-1995 Abolished

电子设备用固定电阻器 第5部分:空白详细规范 精密固定电阻器 评定水平 F

Fixed resistors for use in electronic equipment--Part 5:Blank detail specification--Fixed precision resistors--Assessment level F

ICS: 31.040.10
1996-08-01
GB/T 15883-1995 Abolished

电子设备用膜固定电阻网络 第2部分:按能力批准程序评定质量的膜电阻网络空白详细规范 评定水平E

Fixed film resistor networks for use in electronic equipment--Part 2:Blank detail specification for film resistor networks of assessedquality on the basis of the capability approval procedure--Assessment level E

ICS: 31.040.10
1996-08-01
GB/T 15882-1995 Abolished

电子设备用膜固定电阻网络 第2部分:按能力批准程序评定质量的膜电阻网络分规范

Fixed film resistor networks for use in electronic equipment--Part 2:Sectional specification for film resistor networks of assessed quality on the basis of the capability approval procedure

ICS: 31.040
1996-08-01
GB/T 15881-1995 Active

电子设备用电位器 第3部分:空白详细规范 旋转式精密电位器 评定水平E

Potentiometers for use in electronic equipment--Part 3:Blank detail specification--Rotary precision potentiometers--Assessment level E

ICS: 31.040.20
1996-08-01
GB/T 15880-1995 Active

电子设备用电位器 第3部分:分规范 旋转式精密电位器

Potentiometers for use in electronic equipment--Part 3:Sectional specification--Rotary precision potentiometers

ICS: 31.040.20
1996-08-01
GB/T 15871-1995 Active

硬面光掩模基板

Hard surface photomask substrates

ICS: 31.030
1996-08-01
GB/T 15870-1995 Active

硬面光掩模用铬薄膜

Chrome thin films for hard surface photomasks

ICS: 31.030
1996-08-01
GB/T 6428-1995 Active

氢闸流管测试方法

Methods of the measurement for hydrogen thyratron tubes

ICS: 31.080.20
1996-08-01
GB/T 15873-1995 Active

半导体设施接口技术文件编写导则

Directives for drafting semiconductor facilities interface specification

ICS: 31.220.10
1996-08-01
GB/T 2471-1995 Abolished

电阻器和电容器优先数系

Preferred number series for resistors and capacitors

ICS: 31.020
1996-08-01
GB/T 15879-1995 Abolished

半导体器件的机械标准化 第5部分:用于集成电路载带自动焊(TAB)的推荐值

Mechanical standardization of semiconductor devices--Part 5:Recommendations applying to tape automated bonding (TAB) of integrated circuits

ICS: 31.200
1996-08-01
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