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炭素材料体积密度测定方法
Carbon materials-determination method of the bulk density
炭素材料内在水分的测定
Carbon materials-determination moisture in air-dried sample
炭素材料全硫含量测定方法
Carbon materials-determination of the total sulphur content
炭素材料电阻率测定方法
Method for determination of specific resistance of carbon materials
硅抛光片表面质量目测检验方法
Standard method for measuring the surface quality of polished silicon slices by visual inspection
硅片表面平整度测试方法
Testing methods for surface flatness of silicon slices
硅片厚度和总厚度变化测试方法
Test method for thickness and total thickness variation of silicon slices
硅多晶断面夹层化学腐蚀检验方法
Polycrystalline silicon-examination method-assessment of sandwiches on cross-section by chemical corrosion
硅抛光片氧化诱生缺陷的检验方法
Test method for detection of oxidation induced defects in polished silicon wafers
酸浸取 电感耦合等离子质谱仪测定多晶硅表面金属杂质
Test method for measuring surface metal contamination of polycrystalline silicon by acid extraction-inductively coupled plasma mass spectrometry
半导体单晶晶向测定方法
Testing methods for determining the orientation of a semiconductor single crystal
硅晶体完整性化学择优腐蚀检验方法
Testing method for crystallographic perfection of silicon by preferential etch techniques
硅和锗体内少数载流子寿命测定光电导衰减法
Test methods for minority carrier lifetime in bulk germanium and silicon by measurement of photoconduetivity decay
硅外延层载流子浓度测定 汞探针电容-电压法
Silicon epitaxial layers-determination of carrier concentration-mercury probe voltages-capacitance method
硅外延层、扩散层和离子注入层薄层电阻的测定 直排四探针法
Test method for sheet resistance of silicon epitaxial, diffused and ion-implanted layers using a collinear four-probe array
硅片直径测量方法
Test method for measuring diameter of semiconductor wafer
半导体材料术语
Semiconductor materials-terms and definitions
变频器供电同步电动机设计与应用指南
Cuide for the design and application of synchronous motors for converter supply
低压成套开关设备和控制设备的电气安全应用指南 第1部分：成套开关设备
Application guide for electric safety of low-voltage switchgear and controlgear assemblies - Part 1: Switchgear assemblies
高压开关设备和控制设备的抗震要求
Seismic qualification for high-voltage switchgear and controlgear